IP Library › Granted Patent US 5,710,711
Granted Patent Utility
US 5,710,711 · App. 08/550,421

Method and integrated circuit adapted for partial scan testability

Inventors: Kwang-Ting Cheng, Jing-Yang Jou
Patented Case View Patent ↗
Granted: Jan 20, 1998 Filed: Oct 30, 1995
Inventors
Kwang-Ting Cheng
Jing-Yang Jou
Assignee (at issue)
LUCENT TECHNOLOGIES INC.

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Quick Facts
Patent No.
US 5,710,711
App. No.
08/550,421
Filed
1995-10-30
Granted
1998-01-20
Kind
A