Granted Patent
Utility
US 5,726,991 · App. 08/545,915
Integral bit error rate test system for serial data communication links
Inventors:
Dao-Long Chen, Robert D. Waldron, Khanh Nguyen
Patented Case
View Patent ↗
Granted: Mar 10, 1998
Filed: Oct 20, 1995
Inventors
Dao-Long Chen
Robert D. Waldron
Khanh Nguyen
Assignees (at issue)
AT&T Global Information Solutions Company
Hyundai Electronics America
Symbios Logic Inc.
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.