Granted Patent
Utility
US 5,731,876 · App. 08/718,077
Method and apparatus for on-line determination of the thickness of a multilayer film using a partially reflecting roller and low coherence reflectometry
Inventors:
Shalini Venkatesh, Brian L. Heffner, Wayne V. Sorin
Patented Case
View Patent ↗
Granted: Mar 24, 1998
Filed: Sep 17, 1996
Inventors
Shalini Venkatesh
Brian L. Heffner
Wayne V. Sorin
Assignee (at issue)
Hewlett-Packard Company, L.P.
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.