Granted Patent
Utility
US 5,732,121 · App. 08/731,001
Method for detecting abnormal patterns
Inventors:
Hideya Takeo, Nobuyoshi Nakajima
Patented Case
View Patent ↗
Granted: Mar 24, 1998
Filed: Oct 9, 1996
Inventors
Hideya Takeo
Nobuyoshi Nakajima
Assignee (at issue)
Fujitsu Limited
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.