IP Library Granted Patent US 5,767,523
Granted Patent Utility
US 5,767,523 · App. 08/838,549

Multiple detector alignment system for photolithography

Inventor: Andrew W. McCullough
Patented Case View Patent ↗
Granted: Jun 16, 1998 Filed: Apr 9, 1997
Inventor
Andrew W. McCullough
Assignee (at issue)
SVG Lithography Systems, Inc.

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Quick Facts
Patent No.
US 5,767,523
App. No.
08/838,549
Filed
1997-04-09
Granted
1998-06-16
Kind
A