Granted Patent
Utility
US 5,790,561 · App. 08/785,068
Internal testability system for microprocessor-based integrated circuit
Inventors:
Craig E. Borden, Miguel Martinez, Alexander D. Taylor
Patented Case
View Patent ↗
Granted: Aug 4, 1998
Filed: Jan 17, 1997
Inventors
Craig E. Borden
Miguel Martinez
Alexander D. Taylor
Assignee (at issue)
Rockwell International Corporation
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.