Granted Patent
Utility
US 5,805,611 · App. 08/773,068
Method and apparatus for testing high-frequency integrated circuits using a lower-frequency tester
Inventor:
David C. McClure
Patented Case
View Patent ↗
Granted: Sep 8, 1998
Filed: Dec 26, 1996
Inventor
David C. McClure
Assignee (at issue)
STMICROELECTRONICS, INC.
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.