Granted Patent
Utility
US 5,808,947 · App. 08/710,357
Integrated circuit that supports and method for wafer-level testing
Inventor:
David C. McClure
Patented Case
View Patent ↗
Granted: Sep 15, 1998
Filed: Sep 17, 1996
Inventor
David C. McClure
Assignee (at issue)
STMICROELECTRONICS, INC.
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.