Granted Patent
Utility
US 5,812,354 · App. 08/838,037
Semiconductor integrated circuit device having substrate potential detecting circuit less damaged by static charge propagated thereto through shared conductive line
Inventor:
Makoto Miyazawa
Patented Case
View Patent ↗
Granted: Sep 22, 1998
Filed: Apr 22, 1997
Inventor
Makoto Miyazawa
Assignee (at issue)
NEC CORPORATION
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.