IP Library › Granted Patent US 5,812,354
Granted Patent Utility
US 5,812,354 · App. 08/838,037

Semiconductor integrated circuit device having substrate potential detecting circuit less damaged by static charge propagated thereto through shared conductive line

Inventor: Makoto Miyazawa
Patented Case View Patent ↗
Granted: Sep 22, 1998 Filed: Apr 22, 1997
Inventor
Makoto Miyazawa
Assignee (at issue)
NEC CORPORATION

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Quick Facts
Patent No.
US 5,812,354
App. No.
08/838,037
Filed
1997-04-22
Granted
1998-09-22
Kind
A