Granted Patent
Utility
US 5,818,849 · App. 08/721,428
IC testing apparatus
Inventor:
Toshio Komatsu
Patented Case
View Patent ↗
Granted: Oct 6, 1998
Filed: Sep 27, 1996
Inventor
Toshio Komatsu
Assignee (at issue)
Nippon Precision Circuits Inc.
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.