IP Library › Granted Patent US 5,822,877
Granted Patent Utility
US 5,822,877 · App. 08/670,176

Multi-probe system for dimensional metrology

Inventor: YuZhong Dai
Patented Case View Patent ↗
Granted: Oct 20, 1998 Filed: Jun 20, 1996
Inventor
YuZhong Dai
Assignee (at issue)
Brown & Sharpe Manufacturing Co.

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Quick Facts
Patent No.
US 5,822,877
App. No.
08/670,176
Filed
1996-06-20
Granted
1998-10-20
Kind
A