Granted Patent
Utility
US 5,841,784 · App. 08/626,540
Testing and repair of embedded memory
Inventors:
Tsiu C. Chan, Lawrence Philip Eng
Patented Case
View Patent ↗
Granted: Nov 24, 1998
Filed: Apr 2, 1996
Inventors
Tsiu C. Chan
Lawrence Philip Eng
Assignee (at issue)
STMICROELECTRONICS, INC.
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.