Granted Patent
Utility
US 5,852,581 · App. 08/663,515
Method of stress testing memory integrated circuits
Inventors:
Ray Beffa, Leland R. Nevill, Warren M. Farnworth, Eugene H. Cloud, William K. Waller
Patented Case
View Patent ↗
Granted: Dec 22, 1998
Filed: Jun 13, 1996
Inventors
Ray Beffa
Leland R. Nevill
Warren M. Farnworth
Eugene H. Cloud
William K. Waller
Assignee (at issue)
Micron Technology, Inc.
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.