IP Library › Granted Patent US 5,896,039
Granted Patent Utility
US 5,896,039 · App. 08/878,613

Configurable probe pads to facilitate parallel testing of integrated circuit devices

Inventors: Michael Brannigan, Mark A. Lysinger, David C. McClure
Patented Case View Patent ↗
Granted: Apr 20, 1999 Filed: Jun 19, 1997
Inventors
Michael Brannigan
Mark A. Lysinger
David C. McClure
Assignee (at issue)
STMICROELECTRONICS, INC.

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Quick Facts
Patent No.
US 5,896,039
App. No.
08/878,613
Filed
1997-06-19
Granted
1999-04-20
Kind
A