Granted Patent
Utility
US 5,959,726 · App. 08/900,341
Modulation transfer function test compensation for test pattern duty cycle
Inventors:
James K. Riley, William E. Ortyn, Yuhui Cheng, Tuan Phan, Wayne A. Biggs
Patented Case
View Patent ↗
Granted: Sep 28, 1999
Filed: Jul 25, 1997
Inventors
James K. Riley
William E. Ortyn
Yuhui Cheng
Tuan Phan
Wayne A. Biggs
Assignee (at issue)
Neopath, Inc.
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.