Granted Patent
Utility
US 5,991,212 · App. 08/889,100
Semi-conductor integrated circuit device having an external memory and a test method therefor
Inventor:
Ryuji Ishida
Patented Case
View Patent ↗
Granted: Nov 23, 1999
Filed: Jul 7, 1997
Inventor
Ryuji Ishida
Assignee (at issue)
NEC CORPORATION
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.