Granted Patent
Utility
US 6,037,792 · App. 08/771,645
Burn-in stress test mode
Inventor:
David C. McClure
Patented Case
View Patent ↗
Granted: Mar 14, 2000
Filed: Dec 21, 1996
Inventor
David C. McClure
Assignee (at issue)
STMICROELECTRONICS, INC.
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.