Granted Patent
Utility
US 6,049,589 · App. 09/103,389
X-ray fluorescence measuring system making use of polarized excitation radiation, and X-ray tube
Inventor:
Heikki Johannes Sipilä
Patented Case
View Patent ↗
Granted: Apr 11, 2000
Filed: Jun 24, 1998
Inventor
Heikki Johannes Sipilä
Assignee (at issue)
Metorex International Oy.
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.