Granted Patent
Utility
US 6,052,626 · App. 09/006,013
Parametric analyzing method for calculating light intensity
Inventor:
Hirotomo Inui
Patented Case
View Patent ↗
Granted: Apr 18, 2000
Filed: Jan 12, 1998
Inventor
Hirotomo Inui
Assignee (at issue)
NEC CORPORATION
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.