Granted Patent
Utility
US 6,066,854 · App. 09/138,330
Method of writing cross pattern in adjacent areas of layer sensitive to charged particle beam for improving stitching accuracy without sacrifice of throughput
Inventor:
Takao Tamura
Patented Case
View Patent ↗
Granted: May 23, 2000
Filed: Aug 24, 1998
Inventor
Takao Tamura
Assignee (at issue)
NEC CORPORATION
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.