IP Library › Granted Patent US 6,066,854
Granted Patent Utility
US 6,066,854 · App. 09/138,330

Method of writing cross pattern in adjacent areas of layer sensitive to charged particle beam for improving stitching accuracy without sacrifice of throughput

Inventor: Takao Tamura
Patented Case View Patent ↗
Granted: May 23, 2000 Filed: Aug 24, 1998
Inventor
Takao Tamura
Assignee (at issue)
NEC CORPORATION

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Quick Facts
Patent No.
US 6,066,854
App. No.
09/138,330
Filed
1998-08-24
Granted
2000-05-23
Kind
A