Granted Patent
Utility
US 6,081,466 · App. 09/183,451
Stress test mode entry at power up for low/zero power memories
Inventors:
David C. McClure, Tom Youssef
Patented Case
View Patent ↗
Granted: Jun 27, 2000
Filed: Oct 30, 1998
Inventors
David C. McClure
Tom Youssef
Assignee (at issue)
STMICROELECTRONICS, INC.
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.