Granted Patent
Utility
US 6,107,815 · App. 08/605,901
Test circuit and testing method for function testing of electronic circuits
Inventors:
Wolfgang Nikutta, Hartmut Schmökel, Gunther Kuchinke, Thomas von der Ropp, Rudolph Walter
Patented Case
View Patent ↗
Granted: Aug 22, 2000
Filed: Feb 23, 1996
Inventors
Wolfgang Nikutta
Hartmut Schmökel
Gunther Kuchinke
Thomas von der Ropp
Rudolph Walter
Assignee (at issue)
Infineon Technologies AG
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.