Granted Patent
Utility
US 6,107,816 · App. 08/846,743
Test apparatus for time dependent dielectric breakdown
Inventors:
Joseph William Kearney, Daniel Mark Wroge
Patented Case
View Patent ↗
Granted: Aug 22, 2000
Filed: Apr 30, 1997
Inventors
Joseph William Kearney
Daniel Mark Wroge
Assignee (at issue)
LUCENT TECHNOLOGIES INC.
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.