Granted Patent
Utility
US 6,122,190 · App. 08/942,691
Semiconductor memory device capable of high speed plural parallel test
Inventor:
Tsukasa Ooishi
Patented Case
View Patent ↗
Granted: Sep 19, 2000
Filed: Sep 29, 1997
Inventor
Tsukasa Ooishi
Assignee (at issue)
MITSUBISHI ELECTRIC CORPORATION
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.