Granted Patent
Utility
US 6,166,681 · App. 09/354,216
Measuring the thickness of materials
Inventors:
Gregory A. Meszaros, Roger Marquardt, David I. Walker, John G. Estocin, Frank L. Kemeny
Patented Case
View Patent ↗
Granted: Dec 26, 2000
Filed: Jul 15, 1999
Inventors
Gregory A. Meszaros
Roger Marquardt
David I. Walker
John G. Estocin
Frank L. Kemeny
Assignee (at issue)
USX Corporation
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.