IP Library › Granted Patent US 6,184,134
Granted Patent Utility
US 6,184,134 · App. 09/506,892

Dry process for cleaning residues/polymers after metal etch

Inventors: Nirmal Chaudhary, Xian J. Ning, George Stojakovic
Patented Case View Patent ↗
Granted: Feb 6, 2001 Filed: Feb 18, 2000
Inventors
Nirmal Chaudhary
Xian J. Ning
George Stojakovic
Assignee (at issue)
Infineon Technologies North America Corp.

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Quick Facts
Patent No.
US 6,184,134
App. No.
09/506,892
Filed
2000-02-18
Granted
2001-02-06
Kind
A