Granted Patent
Utility
US 6,194,235 · App. 09/482,409
Method of fabricating and testing an embedded semiconductor device
Inventor:
Manny K. F. Ma
Patented Case
View Patent ↗
Granted: Feb 27, 2001
Filed: Jan 12, 2000
Inventor
Manny K. F. Ma
Assignee (at issue)
Micron Technology, Inc.
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.