Granted Patent
Utility
US 6,199,422 · App. 09/056,157
Method and system for fast probe failure determination
Inventors:
Johannes I. Boerhout, Phillip L. Maness, Hoa Nguyen, Wane D. Wier
Patented Case
View Patent ↗
Granted: Mar 13, 2001
Filed: Apr 6, 1998
Inventors
Johannes I. Boerhout
Phillip L. Maness
Hoa Nguyen
Wane D. Wier
Assignee (at issue)
SKF Condition Monitoring Inc.
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.