Granted Patent
Utility
US 6,211,803 · App. 09/191,154
Test circuit and method for measuring switching point voltages and integral non-linearity (INL) of analog to digital converters
Inventor:
Stephen K. Sunter
Patented Case
View Patent ↗
Granted: Apr 3, 2001
Filed: Nov 12, 1998
Inventor
Stephen K. Sunter
Assignee (at issue)
LogicVision, Inc.
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.