Granted Patent
Utility
US 6,242,734 · App. 09/659,023
Scanning probe microscope assembly and method for making confocal, spectrophotometric, near-field, and scanning probe measurements and associated images
Inventor:
Victor B. Kley
Patented Case
View Patent ↗
Granted: Jun 5, 2001
Filed: Sep 8, 2000
Inventor
Victor B. Kley
Assignee (at issue)
General Nanotechnology LLC
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.