Granted Patent
Utility
US 6,246,251 · App. 09/298,659
Test process and apparatus for testing singulated semiconductor die
Inventor:
Wesley Gallagher
Patented Case
View Patent ↗
Granted: Jun 12, 2001
Filed: Apr 23, 1999
Inventor
Wesley Gallagher
Assignee (at issue)
International Rectifier Corporation
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.