Granted Patent
Utility
US 6,252,242 · App. 07/985,632
High speed optical inspection apparatus using Gaussian distribution analysis and method therefore
Inventors:
Andrei Brunfeld, Joseph Shamir, Gregory Toker, Liviu Singher, Ilan Laver, Ely Pekel
Patented Case
View Patent ↗
Granted: Jun 26, 2001
Filed: Dec 3, 1992
Inventors
Andrei Brunfeld
Joseph Shamir
Gregory Toker
Liviu Singher
Ilan Laver
Ely Pekel
Assignee (at issue)
Brown & Sharpe Surface Inspection Systems, Inc.
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.