Granted Patent
Utility
US 6,260,998 · App. 09/487,365
Method for specifying accelerated thermal cycling tests for electronic solder joint durability
Inventors:
George Albert Garfinkel, James M. Hu, Jacob Frimenko, Robert C. Harris, Robert E. Murray, John Bengt Abrahamsson
Patented Case
View Patent ↗
Granted: Jul 17, 2001
Filed: Jan 19, 2000
Inventors
George Albert Garfinkel
James M. Hu
Jacob Frimenko
Robert C. Harris
Robert E. Murray
John Bengt Abrahamsson
Assignee (at issue)
Visteon Global Technologies, Inc.
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.