Granted Patent
Utility
US 6,272,656 · App. 09/172,160
Semiconductor integrated circuit including test facilitation circuit and test method thereof
Inventor:
Masayuki Yoshiyama
Patented Case
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Granted: Aug 7, 2001
Filed: Oct 14, 1998
Inventor
Masayuki Yoshiyama
Assignee (at issue)
Kawasaki Steel Corporation
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.