Granted Patent
Utility
US 6,294,327 · App. 09/013,596
Apparatus and method for detecting samples labeled with material having strong light scattering properties, using reflection mode light and diffuse scattering
Inventors:
Ian Walton, Mark Trulson, Richard P. Rava
Patented Case
View Patent ↗
Granted: Sep 25, 2001
Filed: Jan 26, 1998
Inventors
Ian Walton
Mark Trulson
Richard P. Rava
Assignee (at issue)
AFFYMETRIX, INC.
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.