Granted Patent
Utility
US 6,297,995 · App. 09/440,721
Circuit configuration with a temperature-dependent semiconductor component test and repair logic circuit
Inventors:
Roderick Mc Connell, Detlev Richter
Patented Case
View Patent ↗
Granted: Oct 2, 2001
Filed: Nov 15, 1999
Inventors
Roderick Mc Connell
Detlev Richter
Assignee (at issue)
Siemens Aktiengesellschaft
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.