Granted Patent
Utility
US 6,327,687 · App. 09/619,985
Test pattern compression for an integrated circuit test environment
Inventors:
Janusz Rajski, Jerzy Tyszer, Mark Kassab, Nilanjan Mukherjee
Patented Case
View Patent ↗
Granted: Dec 4, 2001
Filed: Jul 20, 2000
Inventors
Janusz Rajski
Jerzy Tyszer
Mark Kassab
Nilanjan Mukherjee
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.