Granted Patent
Utility
US 6,339,217 · App. 08/776,361
Scanning probe microscope assembly and method for making spectrophotometric, near-field, and scanning probe measurements
Inventor:
Victor B. Kley
Patented Case
View Patent ↗
Granted: Jan 15, 2002
Filed: May 16, 1997
Inventor
Victor B. Kley
Assignee (at issue)
General Nanotechnology LLC
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.