Granted Patent
Utility
US 6,340,895 · App. 09/353,214
Wafer-level burn-in and test cartridge
Inventors:
Frank O. Uher, John Andberg, Mark C. Carbone, Donald P. Richmond, II
Patented Case
View Patent ↗
Granted: Jan 22, 2002
Filed: Jul 14, 1999
Inventors
Frank O. Uher
John Andberg
Mark C. Carbone
Donald P. Richmond, II
Assignee (at issue)
AEHR TEST SYSTEMS
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.