Granted Patent
Utility
US 6,351,135 · App. 09/342,514
TDDB test pattern and method for testing TDDB of MOS capacitor dielectric
Inventor:
Ha Zoong Kim
Patented Case
View Patent ↗
Granted: Feb 26, 2002
Filed: Jun 29, 1999
Inventor
Ha Zoong Kim
Assignee (at issue)
LG Semicon Co., Ltd.
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.