IP Library Granted Patent US 6,372,609
Granted Patent Utility
US 6,372,609 · App. 09/555,687

Method of Fabricating SOI wafer by hydrogen ION delamination method and SOI wafer fabricated by the method

Inventors: Hiroji Aga, Naoto Tate, Kiyoshi Mitani
Patented Case View Patent ↗
Granted: Apr 16, 2002 Filed: Jun 2, 2000
Inventors
Hiroji Aga
Naoto Tate
Kiyoshi Mitani
Assignees (at issue)
SHIN-ETSU HANDOTAI CO., LTD.
SOITEC SA

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Quick Facts
Patent No.
US 6,372,609
App. No.
09/555,687
Filed
2000-06-02
Granted
2002-04-16
Kind
B1