Granted Patent
Utility
US 6,390,674 · App. 09/482,807
Thermal analysis apparatus and method capable of accurately measuring a temperature of a large diameter sample
Inventors:
Nobutaka Nakamura, Kanji Nagasawa
Patented Case
View Patent ↗
Granted: May 21, 2002
Filed: Jan 13, 2000
Inventors
Nobutaka Nakamura
Kanji Nagasawa
Assignee (at issue)
SEIKO INSTRUMENTS INC.
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.