Granted Patent
Utility
US 6,413,215 · App. 09/660,639
Implant wear debris detection apparatus and method
Inventors:
Junru Wu, Eric M. Weissman, Elmer D. Dickens, Jr.
Patented Case
View Patent ↗
Granted: Jul 2, 2002
Filed: Sep 13, 2000
Inventors
Junru Wu
Eric M. Weissman
Elmer D. Dickens, Jr.
Assignee (at issue)
University of Vermont
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.