IP Library › Granted Patent US 6,479,373
Granted Patent Utility
US 6,479,373 · App. 09/884,188

Method of structuring layers with a polysilicon layer and an overlying metal or metal silicide layer using a three step etching process with fluorine, chlorine, bromine containing gases

Inventors: Joerg Dreybrodt, Dirk Drescher, Ralf Zedlitz, Stephan Wege
Patented Case View Patent ↗
Granted: Nov 12, 2002 Filed: Jun 19, 2001
Inventors
Joerg Dreybrodt
Dirk Drescher
Ralf Zedlitz
Stephan Wege
Assignee (at issue)
Infineon Technologies AG

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Quick Facts
Patent No.
US 6,479,373
App. No.
09/884,188
Filed
2001-06-19
Granted
2002-11-12
Kind
B2