IP Library Granted Patent US 6,502,051
Granted Patent Utility
US 6,502,051 · App. 09/526,677

Method and apparatus for optimizing testing sequences for electronic equipment

Inventor: Joseph P. Coyle
Patented Case View Patent ↗
Granted: Dec 31, 2002 Filed: Mar 16, 2000
Inventor
Joseph P. Coyle
Assignee (at issue)
Sun Microsystems Inc.

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Quick Facts
Patent No.
US 6,502,051
App. No.
09/526,677
Filed
2000-03-16
Granted
2002-12-31
Kind
B1