Granted Patent
Utility
US 6,531,707 · App. 09/842,842
Machine vision method for the inspection of a material for defects
Inventors:
Patrice Favreau, Jeffrey Wolinsky, Markku E. Jaaskelainen
Patented Case
View Patent ↗
Granted: Mar 11, 2003
Filed: Apr 27, 2001
Inventors
Patrice Favreau
Jeffrey Wolinsky
Markku E. Jaaskelainen
Assignee (at issue)
Cognex Corporation
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.