Granted Patent
Utility
US 6,556,306 · App. 09/754,183
Differential time domain spectroscopy method for measuring thin film dielectric properties
Inventors:
Zhiping Jiang, Ming Li, Xi Zhang
Patented Case
View Patent ↗
Granted: Apr 29, 2003
Filed: Jan 4, 2001
Inventors
Zhiping Jiang
Ming Li
Xi Zhang
Assignee (at issue)
Rensselaer Polytechnic Institute
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.