Granted Patent
Utility
US 6,580,283 · App. 09/353,116
Wafer level burn-in and test methods
Inventors:
Mark C. Carbone, Frank O. Uher, John Andberg, Jerzy Lobacz, Donald P. Richmond, II
Patented Case
View Patent ↗
Granted: Jun 17, 2003
Filed: Jul 14, 1999
Inventors
Mark C. Carbone
Frank O. Uher
John Andberg
Jerzy Lobacz
Donald P. Richmond, II
Assignee (at issue)
AEHR TEST SYSTEMS
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.