Granted Patent
Utility
US 6,584,169 · App. 10/153,508
X-ray mapping analysis method
Inventor:
Kiyoshi Hasegawa
Patented Case
View Patent ↗
Granted: Jun 24, 2003
Filed: May 22, 2002
Inventor
Kiyoshi Hasegawa
Assignee (at issue)
SEIKO INSTRUMENTS INC.
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.