Granted Patent
Utility
US 6,597,185 · App. 09/665,370
Apparatus for localized measurements of complex permittivity of a material
Inventors:
Vladimir V. Talanov, Hans M. Christen, Robert Moreland
Patented Case
View Patent ↗
Granted: Jul 22, 2003
Filed: Sep 20, 2000
Inventors
Vladimir V. Talanov
Hans M. Christen
Robert Moreland
Assignee (at issue)
Neocera, LLC
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.